The standard samples used for calibration for the method were 14 certified reference materials supplied by the Geological Survey of Japan. The standards were composed of basic to acidic igneous rocks. The ZSX Primus II WDXRF spectrometer was used for measurement.
The 4 kW high-power X-ray tube of ZSX Primus II is shown to be advantageous in the determination of trace elements. The report shows that XRF is a rapid, precise and accurate method to meet the requirements of silicate rock analysis. It can also minimize skill and time requirements for sample preparation compared to other spectroscopic analysis methods that use wet chemical techniques. The method is widely applicable for geological applications, such as environmental assessment of soil, resource exploration, and process and quality control in mining.
A copy of this report may be requested at: http://www.rigaku.com/products/xrf/primus2/app5018
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